Analytical electron microscopy

The Analytical Electron Microscopy Laboratory offers well established analytical and imaging methods for non-destructive investigation of a wide range of solid samples (rocks, minerals, meteorites, fossils, artefacts, insects, and plants) using a JEOL JXA 6610LV scanning electron microscope (SEM) and a JEOL JXA-8530F electron probe micro analyzer (EPMA).

Our analytical electron microscopes are capable of qualitatively and quantitatively measuring the concentrations of all elements from B to U by means of wavelength-dispersive spectrometry (WDS) and energy-dispersive spectrometry (EDS). The applied analytical technique combines micron-scale chemical analyses with scanning electron microscopy and is capable of large- and small-scale element mapping of specimens. Because of its unique combination of spatial resolution with high analytical precision, our EPMA is one of the few state-of-the-art instruments in Austria.
To achieve high precision analysis, a profound sample preparation is essential. Therefore, we provide well-equipped sample preparation facilities. Beside different polishing disks, two sputtering/coating units are available. A LEICA EM SCD 500 for platinum sputtering and carbon coating and a HUMMER V for gold sputtering.

SE image of a sea urchin

SE image of a fly's eye

SE image of a plant structure

Our instrumental equipment is completed by a portable JEOL JCM 5000 Neoscope tabletop scanning electron microscope. This device is designed exclusively for imaging and is used by various departments and branches as well as in visitor education. It offers a high-quality supplement to light microscopy.

As a sub-unit of the Central Research Laboratories at the NHM Vienna, the Analytical Electron Microscopy Laboratory serves the entire museum. The electron microscopy facilities are also available for external users - including academic research collaborations (national and international) as well as commercial users (contract based).

Online-Tickets